Atomic Force Microscopy

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Atomic force microscopy (AFM) is one type of scanning probe microscopy that has been widely used for material local characterization or manipulation with
nanoscale resolution.

Many functions have been developed based on AFM, including but not limited to: Topography imaging, force measurement, nano-manipulation,
nano-lithography, piezoresponse characterization and electrical property characterization, etc.

This talk will introduce several AFM electrical modes, such as piezoresponse force microscopy (PFM), conductive AFM (CAFM), electrostatic force microscopy
(EFM), and Kelvin probe force microscopy (KPFM).

These techniques can be used in various applications to help understand your materials’ electrical behaviours from a nanoscale perspective.